Saturday, February 18, 2012

Test Coverage and Post-Verification Defects: A Multiple Case Study

Why your test coverage is never going to be 100%...
http://dx.doi.org/10.1109/ESEM.2009.5315981

Yet again MS Research has proven to provide interesting and nice paper. In this article they describe dependencies between test effort, test coverage and post-release defect inflow.

It is interesting to note that the effort grows exponentially with test coverage while the post-release quality only linearly. I will recommend that to my students who often ask about the cost of quality....

Looking forward to more research from MS.

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